WDM/FBT Integrated Test System

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WDM/FBT Integrated Test System

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Product Function Introduction

Compatible with scanning and spot testing WDM devices and 1X2, 2X2Coupler products.

Make full use of the low utilization rate of the broadband light source and the spectrum analyzer to realize the sharing of the broadband light source and the spectrometer, which can be used for the four test stations to perform the test by time-sharing multiplexing.

Once wiring, you can perform OSA scan test and single point IL, PDL, INRL, OUTRL, DIR and other parameters.

WDM products can analyze data to calculate IL, RIP, ADJ, NADJ, CWL, DCWL; FBT products can analyze data to calculate IL_Min, IL_Max, WDL and other parameters.

Automatically determine the test results; all data is saved in a large amount through the SQL Server database, and shipment reports are automatically generated in batches.

Schematic diagram of test interface

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System Performance Index

Parameter

 Index

Unit

MIN.

Typical

 MAX.

  Working wavelength

1260


1620

nm

Test Index

ITU IL/Min IL/Max IL/PDL/Ripple/TDL/CWL/Bandwidth/Isolation/PDL/INRL/OUTRL/DIR,etc.


   IL Uncertainty

±0.05(Fiber splicing test)

db

±0.1(Connector test)


 PDL Uncertainty

±0.03

db

 Measuring Mode

 OSA scanning/single power meter point measurement


 Single scan time

6-8 (AQ6370D,1250~1650nm,步距0.1nm)

S

Single point PDL pure measurement time

3-5

S

  Testable product type

CWDM/1x2 Coupler/2x2 Coupler


 

Solution configuration

NO.

Name,Specs.&Description

Remark

1

Broadband light source

 1250~1650nm

2

Spectrum analyzer AQ6370, Agilent86142B, etc.


3

WDM/FBT test host


4

Test industrial computer


5

GPIB-USB-HS


6

1X18光开关1X18 Optical Switch


7

18-channel point light source