CWDM One for Four Scan Test Station

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CWDM One for Four Scan Test Station

shared:

Product Function Introduction

Make full use of the low utilization rate of the broadband light source and the spectrum analyzer to realize the sharing of the broadband light source and the spectrometer, which can be used for the four test stations to time-multiplex and execute the test.

Compatible with CWDM device and module scanning test. Support high and low temperature test, automatic delay control of temperature rise and fall.

Automatically scan and calculate various parameters such as ITU IL, Min IL, Max IL, Ripple, TDL, Isolation, and CWL, Bandwidth under different dB values.

Compatible with complex scanning test and calculation of CWDM modules, such as WDM modules that mix EXP, UPG, Coupler devices and Monitor channels, or special modules that combine multiple modules such as MUX/DEMUX, TX/RX.

Automatically determine the test results; all data is saved in a large amount through the SQL Server database, and shipment

reports are automatically generated in batches.

Schematic diagram of test interface

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System Performance Index

 

Parameter

Index

Unit

Min

Typical

Max

Working Wavelength

1260


1620

nm

Test Index

IL/Ripple/ADJ/NADJ/CWL/BW//TDL,etc.


Uncertainty

±0.05 (Fiber splicing test)

dB

±0.1 (connector test)

 Measuring Mode

OSW Scan


Single channel scan time

6-8(AQ6370,1250~1650nm,步距/Step0.1nm)

S

Testable product type

CWDM器件、CWDM模块、FWDM CWDM                        Device、CWDM Module、FWDM


 

Solution configuration

 NO.

 Name, Specs., Description

Remark

1

 Broadband light source

1250~1650nm

2

 Spectrum analyzer AQ6370, Agilent 86142B, etc.


3

 Optical switch: 1X2, 1X4, 1X18 mechanical test-level optical switch

   Repeatability≤0.01dB

4

Test industrial computer


5

GPIB-USB-HS