DWDM Parallel Scanning One for Four Test Station

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DWDM Parallel Scanning One for Four Test Station

shared:

Product Function Introduction

It supports scanning and PDL testing of different types of DWDM/AWG modules (devices) and 100G Lan WDM devices, with flexible parameter setting, visual interface, and easy operation.

Support multi-station to perform real-time parallel shared scanning test on adjustable light sources, without interfering with each other, no need to wait in line.

Automatic calculation of ITU IL, Min IL, Max IL, IL uniformity, Ripple, PDL, CWL (0.5dB, 1dB, 3dB, etc.), the offset between the center wavelength and the ITU wavelength, Bandwidth, Isolation, Crosstalk and other parameters.

Automatically analyze and calculate the results of various required test parameters, and automatically determine the test results; all quantities are saved in large quantities, and the shipping report is automatically generated.


Schematic diagram of test interface

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System Performance Index

 

Parameter

 Index

Unit

Min

Typical

Max

Working Wavelength

1260


1620

nm

Test Index

ITU IL/Min IL/Max IL/PDL/Ripple/TDL/CWL/Bandwidth/Isolation


Uncertainty

±0.05 (Fiber splicing test)

dB

±0.1 (connector test)

 PDL Uncertainty

±0.03

dB

Measuring Mode

          TLS scan/single power meter spot test


 Single channel scan time

6-10

S


Single point PDL pure measurement time

3-5

S

 

Solution configuration

NO.

  Name, Specs., Description

Remark

1


Adjustable light source, supports various brands of adjustable light sources (with scanning function)


2


High Speed Power Meter


3


Optical switch: 1X2, 1X4 mechanical test-level optical switch

Repeatability≤0.01dB

4


Polarization controller: GM8015-C, GT303-5


5


Test system optical path host

 Custom customized



Test industrial computer



GPIB  cardGPIB cablePCI-GPIB, GPIB-US-HS