Isolator, Circulator Automatic Test Station

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Isolator, Circulator Automatic Test Station

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Product Function Introduction 

Automatically test and calculate various parameters such as IL, PDL, RLin, RLout, ISO, CT, WDL, TDL, etc.

Circulator compatible device and module \ chassis scanning test. Support high and low temperature test, automatic delay control of temperature rise and fall.

Isolator supports the simultaneous testing of 4 devices, using high and low temperature waiting time to improve test productivity and efficiency.

Automatically determine various complex grades for product grade selection.

Automatically determine the test results; all data is saved in a large amount through the SQL Server database, and shipment reports are automatically generated in batches.

Schematic diagram of test interface

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System Performance Index

Parameter

 Index

Unit

Min

Typical

Max

Working Wavelength

1260


1620

nm

Test Index

IL/PDL/RL/DIR/CT/WDT//TDL,etc.


Uncertainty

±0.05 (Fiber splicing test)

db

±0.1 (connector test)

PDL Uncertainty

±0.03

db

Measuring Mode

Point light source+ power meter


   Single channel scan time

15

S


Single point PDL pure measurement time

3-5

S

  Testable product type

Isolator/Circulator


 

 

Solution configuration

NO.

Name, Specs., Description

Remark

1

Adjustable light source

1250~1650nm

2

 Optical power meter, PDL polarization controller


3

 Optical switch: 1X2, 1X4, mechanical test-level optical switch

      Repeatability≤0.01dB

5

Test system optical path host

 Custom made

6

Test industrial computer


7

GPIB  cardGPIB cablePCI-GPIB, GPIB-US-HS