AWG Planar Waveguide Chip Automatic Test Station

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AWG Planar Waveguide Chip Automatic Test Station

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Product Function Introduction

The station design framework of double-sided 14 axis high-precision stepper motor, combined with high-precision eddy current sensor and special algorithm, used to quickly find the position of max optical power, and then use the optical spectrum to scanning raw data and analyze test results.

The bar chip test compatible with quartz glass and silicon chip materials.

Process operation, compatible with AWG / cwdm4 / PLC and other types of planar waveguide product's test.

Single chip alignment time 30 seconds, repeatability < 0.1dB.

Single chip test time 30 seconds(4 state), raw data and test results auto save to the SQL Server database.

Two-sided eddy current sensor automatic parallels the angles in three directions, auto controls the distance between FA end face (arbitrary angle) and each chip, and has no accumulated errors caused by stroke .

The operation is simple, and there is no dependence on skilled operator. Operator need to manual load the first chip and find the initial light for the first chip. The subsequent granular products are completed automatically. One operator can guard multiple test station.

 

System Performance Index  

Specificaion

Requirements

 unit

Description

Repeatability

0.2

dB


IL repeatability during repeated alignment for the same chip

Stability

0.2

dB

              Maximum  IL  fluctuation  during  10 minutes after applying matching oil

Cycletime

Initial Alignment

4

Min

Time from loading the AWG chip to  completing initial alignment.

Repeat Alignment

35

S

AWG chip alignment time except intial alignment.

RepeatMeasurement

30

S

SANTEC TLS,1260~1350nm, 20nm/sec, 25pm step Muller matrix method(4 state)


Alignment Accuracy

0.2

dB

CWDM4Two direction CWDM AWG(Standard Type)

Analysis parameter

>15

Param

IL,PDL,PDW,Ripple, 0.5/1/3dB bandwith,Adj Crosstalk, Non-Adj crosstalk,Total crosstalk.(Comply with customer requirements)